Method for determining position and position measurement device for carrying out said method

ABSTRACT

A method for position determination that includes generating a first position-dependent scanning signal and a second position-dependent scanning signal, transmitting the first position-dependent scanning signal from a scanning location via a first scanning channel to a first storage element, storing a first instantaneous value present at the first storage elements at a first storage time. Transmitting the second position-dependent scanning signal from the scanning location via a second scanning channel to a second storage element and storing a second instantaneous value present at the second storage elements at a second storage time and forming a measured position value from the first stored instantaneous value and the second stored instantaneous value. A difference exists between a first transit time of the first position-dependent scanning signal in the first scanning channel and a second transit time of the second position-dependent scanning signal in the second scanning channel, the difference is compensated by individually delaying the first and second position-dependent scanning signals, so that the stored first and second instantaneous values have appeared at a common time at the scanning location.

[0001] The invention relates to a method for position determination in accordance with the preamble of claims 1, or 2, as well as a position measuring device for executing the method in accordance with the preamble of claims 7, or 8.

[0002] Incremental position measuring methods and position measuring devices are employed for the highly accurate measurement of the position of moved objects on machinery, such as machine tools or wafer steppers, for example. In the course of this, the position measuring device must measure the position of the object at strictly defined times, and the position must be supplied to the electronic control device which controls the movement of the object. The times are defined by the external electronic control device. So that a position value can be made available at these times, the position measuring device determines position measuring values in a predetermined time grid or on the basis of an external signal by interpolation of several scanning signals of the same frequency, which are offset with respect to each other.

[0003] In accordance with DE 27 29 697 A1, memory devices in the form of sample and holding circuits are arranged upstream of the interpolation unit, by means of which the instantaneous values of all scanning signals are simultaneously stored at the preset times. Position measuring values are formed in the interpolation unit from these instantaneous values. As expressly mentioned in DE 27 29 697 A1, this method is particularly suited to the measurement of moved objects.

[0004] It is disadvantageous here that the scanning signals in the individual scanning channels are affected by the signal generation—i.e. from the scanning location—up to the memory devices by different transit delays, which results in measurement errors in the interpolation.

[0005] It is therefore the object of the invention to remove this disadvantage and in this way to increase the accuracy of the measurements.

[0006] This object is attained by a method having the characteristics of claims 1, or 2, as well as by means of a position measuring device having the characteristics of claims 7, or 8.

[0007] Advantageous embodiments are recited in the dependent claims.

[0008] The invention will be explained in greater detail by means of exemplary embodiments and with the aid of the drawings.

[0009] Shown are in:

[0010]FIG. 1, a first position measuring device in accordance with the invention,

[0011]FIG. 2, a circuit arrangement for a frequency-dependent delay of the stored command,

[0012]FIG. 3, an arrangement for determining the transit time in a scanning channel,

[0013]FIG. 4, a second arrangement for determining the transit time,

[0014]FIG. 5, a third arrangement for determining the transit time, and

[0015]FIG. 6, a second position measuring device in accordance with the invention.

[0016] A first embodiment of the invention will be explained by means of FIGS. 1 to 5. A photoelectric incremental position measuring device is schematically represented in FIG. 1. In a known manner it consists of a scale 1, which can be moved in the measuring direction X and has a periodic graduation 2. The graduation 2 is illuminated by a light source 3, and the light beam is modulated by the graduation 2 as a function of the instantaneous position of the scale 1. Three optical scanning signals, which are offset with respect to each other by 120°, are generated. Each one of the scanning signals is conducted from the scanning location A to photo-detectors 7, 8, 9 via optical wave guides 4, 5, 6 and is converted there into electrical scanning signals S1, S2, S3. The electrical scanning signals S1, S2, S3 are conducted to amplifiers 10, 11, 12 and finally reach storage elements 13, 14, 15, in each of which an instantaneous value of the scanning signals S1, S2, S3 is stored by means of a storage command T. The stored instantaneous values are conducted to an interpolation unit 16, in which a measured position value P is formed, which defines the absolute position of the graduation 2 within a graduation period or a fraction of a graduation period. The measured position value P is made available to an evaluation unit, not represented, integrated into the position measuring device, or to an external evaluation unit, where it is combined with a counter setting, which defines the graduation periods or fractions of the graduation periods.

[0017] The transmission distance from the scanning location A, i.e. starting from the generation of the optical scanning signals, up to the storage elements 13, 14, 15 will be called scanning channel K1, K2, K3 in what follows. Each scanning channel K1, K2, K3 contains components which affect the transit time of the scanning signals S1, S2, S3. In the example, these components consist of respective optical wave guides 4, 5, 6, photo-detectors 7, 8, 9, as well as amplifiers 10, 11, 12, and electrical conductors. The sums of the optical and electrical transit times are different in the individual scanning channels K1, K2, K3. This results from differing conductor lengths and component scattering.

[0018] In accordance with the first embodiment of the invention, the different transit times of the scanning signals S1, S2, S3 in the individual scanning channels K1, K2, K3 are compensated in that the storing of instantaneous values of the scanning signals S1, S2, S3 takes place in a manner where they are adapted to the different transit times. The storage of at least one of the scanning signals S1, S2, S3 is delayed by an adjustable amount of time with respect to one of the further scanning signals S1, S2, S3. It is assured by means of this that all stored instantaneous values of the scanning signals S1, S2, S3 are scanning signals S1, S2, S3 which appear simultaneously at the scanning location A. It is thus possible to set the time delay between the appearance of the instantaneous values at the scanning location A and the storing in the storage elements 13, 14, 15 to a constant value for all scanning channels K1, K2, K3. In this case this time offset can be taken into account and compensated in the subsequent calculations by means of interpolation or extrapolation methods of positional values.

[0019] Delay members 20, 21, 22 in the form of digitally adjustable delay lines are provided for the individual delay of the common storage command T, so that the common storage command T is sent individually matched and delayed to the storage elements 13, 14, 15 as storage commands T1, T2, T3.

[0020] It is important here that the delay members 20, 21, 22 are adjusted in such a way that all stored instantaneous values of the scanning signals S1, S2, S3 are the result of instantaneous values which occurred at the same time at the scanning location A. Thus, for all scanning channels K1, K2, K3 the interpolation unit 16 sees a constant delay between the common storage command T and the appearance of the instantaneous values of all scanning signals S1, S2, S3 at the scanning location A. Differing delays in the transmission of the storage command T, or of the commands T1, T2, T3, are also taken into consideration and evened out by means of the steps in accordance with the invention.

[0021] The delay by the delay members 20, 21, 22 can be adjusted in such a way that no time offset results between the appearance of the storage command T and the appearance of the instantaneous values of the stored scanning signals S1, S2, S3 at the scanning location A. In this case the transit time of each one of the scanning signals S1, S2, S3, starting at the scanning location A, to the storage elements 13, 14, 15—i.e. in the scanning channels K1, K2, K3—exactly corresponds to the set delay time of the common storage command in the respective delay members 20, 21, 22.

[0022] The storage elements 13, 14, 15 can be analog-digital converters, which receive the instantaneously present analog value of the scanning signals S1, S2, S3 at the time of the storage commands T1, T2, T3 and change them A/D. However, the storage elements 13, 14, 15 can also be sample-and-hold elements, which store the instantaneous value of the scanning signals S1, S2, S3 at the time of the storage commands T1, T2, T3 and make it available to the interpolation unit 16. The storage elements 13, 14, 15 can be arranged at any arbitrary location in the scanning channels K1, K2, K3, in this case the delay members 20, 21, 22 assigned to them must compensate the transit time difference of the individual scanning signals S1, S2, S3 occurring between the scanning location A and the storage elements 13, 14, 15.

[0023] The interpolation unit 16 divides a signal period of the scanning signals S1, S2, S3 into smaller steps. This division takes place on the basis of analog or digital instantaneous values of the scanning signals S1, S2, S3, which are phase-shifted in relation to each other. For this purpose, commercially available interpolation units 16 employ sinusoidal scanning signals S1, S2, S3, which are phase-shifted by 90° in relation to each other. It is therefore advantageous to convert the three scanning signals, phase-shifted by 120° in relation to each other, into two scanning signals, phase-shifted by 90° in relation to each other, prior to the interpolation, and to supply them in a known manner to an analog- or digitally-operating interpolation unit 16 with a bleeder chain, an arctan computer or a table interpolation.

[0024] No heat sources should be arranged at the measuring location if there are high demands made on measuring accuracy, for example in connection with wafer steppers. For this reason the active components, such as the light source 3, the photo-detectors 7, 8, 9, and the amplifiers 10, 11, 12 are arranged remote from the measuring location. The light is transmitted via optical wave guides 4, 5, 6, some of which are schematically indicated in FIG. 1 or FIG. 2. However, the measuring accuracy is improved by means of the invention even without optical wave guides 4, 5, 6, since the photo-detectors 7, 8, 9 and further electrical components 10, 11, 12 affect the transit time of the scanning signals S1, S2, S3.

[0025] The invention can be particularly advantageously employed in photoelectric position measuring devices having an optically scannable scale 1, but can also be used with interferometers, with magnetically, capacitively, as well as inductively scannable graduations

[0026] The time offset caused by the delay members 20, 21, 22 is determined prior to the measuring operation, for example, and adjusted. This adjustment can be performed with the aid of calibrating measurements and can be adapted during the measuring operation, so that dynamic transit time changes, for example because of the frequency dependence of the amplifiers 10, 11, 12, or temperature drifting, can also be compensated. It is also possible to set the time offset to a desired constant value.

[0027] In the example represented, the adjustment of the time delay of the delay members 20, 21, 22 is performed by a computer 23, so that, besides a static equalization of the delay times in a calibration cycle, a dynamic adjustment is also possible. In this case the delay to be set is formed by means of measured values, which had been previously determined and stored in a correction memory (table) 24, and/or by the known behavior of individual effects, such as the input frequency-dependent transit time of the amplifiers 10, 11, 12.

[0028] The dynamic correction is schematically represented in FIG. 1. The frequency f of the scanning signals S1, S2, S3 is determined on the basis of the measured position values P, or on the basis of one of the scanning signals S1, S2, S3, and the delay time of the delay members 20, 21, 22 is set as a function thereof. Moreover, external influences, such as the temperature t, are measured by means of sensors 25, and the delay time is changed as a function thereof.

[0029] Another possibility of the frequency-dependent adaptation of the delay time is represented in FIG. 2 for a scanning channel. Here, the frequency of the scanning signal 1 is determined and, as a function thereof, the delay time of the delay member 20 is dynamically changed. A frequency counter 17, as well as a memory 18, if required, are provided for this, which assigns the delay member a previously determined and stored delay time as a function of the instantaneous frequency of the scanning signal S1.

[0030] The delay members 20, 21, 22 are digital or analog elements. In an analog operating mode the memory 18 in FIG. 2 is replaced by a frequency voltage converter.

[0031] For measuring the actual transit time of a scanning signal S1, S2, S3 in a scanning channel K1, K2, K3, in accordance with FIG. 3 a pulse I is applied at the scanning location A, for example by the light source 3 provided, or an additional source. The applied pulse I passes over the same distance as a scanning signal S1, S2, S3, and therefore encounters the same delay times. This exemplary embodiment is represented in FIG. 3 for one of the scanning channels, K1. The pulse I is also used as a storage command and there also passes over the same distance as the storage command T during normal measuring operations. The necessary delay time can be determined by measuring the time between the storage command I appearing at the storage element 13 and the pulse I arriving at the storage element 13 through the scanning channel K1 (via elements 7, 10, 13).

[0032] By means of the repeated application of the pulse I and adjustment of the delay time of the delay member 20, the storage of an instantaneous value is displaced in the direction toward the appearance of the pulse I. Thus the delay time is increased until the stored instantaneous value of the scanning signal S1 increases because of the pulse I. Then the storage is adjusted to the ascending flank of the pulse I and the adjusted delay time of the delay member 20 corresponds to the transit time of the pulse I in the scanning channel K1. The delay time can also be increased until the stored instantaneous value is maximal. The determination of the transit time can be performed by calculating the geometric center of gravity of the picked-up pulse I. By means of this, an averaging of the calibration measurements occurs, and errors in the delay members 20, 21, 22, noise and jittering at the time of scanning are reduced. The transit time between the individual scanning channels K1, K2, K3 can be very accurately set by means of correlation methods in particular.

[0033] A further possibility of coupling a pulse I into the scanning channel K1 is represented in FIG. 4. The pulse I is fed in parallel with the photo-detector 7.

[0034] Alternatively to this, in accordance with FIG. 5 the pulse I is applied to a second input of the amplifier 10.

[0035] In connection with a position measuring device with a scale, the generation of the pulse can take place by means of suitable structuring of the scale. In the case of an interferometer, the laser light source can be modulated for generating the pulse I.

[0036] Test signals I of different frequencies are fed into a scanning channel K1, K2, K3 for determining frequency-dependent transit times in one of the scanning channels K1, K2, K3. On the basis of the change in the scanning signals S1, S2, S3 present at the storage elements 13, 14, 15, conclusions regarding the frequency-dependent transit times can be drawn.

[0037] In summary, the first embodiment of the invention therefore relates to a method for position determination with the following method steps:

[0038] generation of several position-dependent scanning signals (S1, S2, S3),

[0039] transmission of each one of the scanning signals (S1, S2, S3) from a scanning location (A) via a scanning channel (K1, K2, K3) to a storage element (13, 14, 15),

[0040] storage of an instantaneous value present at the storage element (13, 14, 15) at a storage time,

[0041] formation of a measured position value (P) from the stored instantaneous values of the scanning signals (S1, S2, S3), wherein

[0042] the transit times of the scanning signals (S1, S2, S3) are different in at least two scanning channels (K1, K2, K3), and storage takes place at times matched to the different transit times, so that the stored instantaneous values of the scanning signals (S1, S2, S3) are instantaneous values which have appeared at a common time at the scanning location (A).

[0043] In summary, the first embodiment of the invention also relates to a position measuring device, having

[0044] a scanning location (A) for the generation of a plurality of position-dependent scanning signals (S1, S2, S3),

[0045] scanning channels (K1, K2, K3) for transmitting the scanning signals (S1, S2, S3) from the scanning location (A) to storage elements (13, 14, 15), wherein a scanning channel (K1, K2, K3) and a storage element (13, 14, 15) are assigned to each scanning signal (S1, S2, S3),

[0046] an evaluating unit (16) for forming a measured position value (P) from instantaneous values of the scanning signals (S1, S2, S3) retrieved from the storage elements (13, 14, 15),

[0047] means (20, 21, 22) for causing the storage of instantaneous values of the scanning signals (S1, S2, S3) for compensating different transit times of the scanning signals (S1, S2, S3) in the scanning channels (K1, K2, K3) at different times, so that the stored instantaneous values of the scanning signals (S1, S2, S3) are instantaneous values which had appeared at a common time at the scanning location (A).

[0048] The above described first embodiment of the invention has the advantage that no additional frequency-dependent components are placed into the scanning channels K1, K2, K3, and that the time delay of the pulse T with defined flanks and defined amplitude can be very exactly adjusted.

[0049] A second exemplary embodiment of a position measuring device will be explained by means of FIG. 6. The compensation of different transit times in the scanning channels K1, K2, K3 is performed by means of transit time members 30, 31, 32 inserted into the scanning channels K1, K2, K3. The design largely corresponds to that of the first position measuring device, so that in all examples components having the same effects are provided with the same reference symbols. The transit time of the scanning signals S1, S2, S3 is statically preset or is dynamically set as a function of the instantaneous frequency of at least one of the scanning signals S1, S2, S3, so that all stored instantaneous values of the scanning signals S1, S2, S3 are simultaneously appearing instantaneous values of the scanning signals S1, S2, S3 at the scanning location A. The time delay between the appearance of the instantaneous values at the scanning location A and the storage in the storage elements 13, 14, 15 can therefore be set to a constant value for all scanning channels K1, K2, K3. This time offset can be taken into consideration and compensated in the subsequent calculations by interpolation or extrapolation methods of position values.

[0050] In summation, the second embodiment of the invention therefore relates to a method for position determination with the following method steps:

[0051] generation of several position-dependent scanning signals (S1, S2, S3),

[0052] transmission of each one of the scanning signals (S1, S2, S3) from a scanning location (A) via a scanning channel (K1, K2, K3) to a storage element (13, 14, 15),

[0053] storage of an instantaneous value present at the storage element (13, 14, 15) at a storage time,

[0054] formation of a measured position value (P) from the stored instantaneous values of the scanning signals (S1, S2, S3), wherein

[0055] different transit times of the scanning signals (S1, S2, S3) in the scanning channels (K1, K2, K3) are compensated by means of the individual delay of the scanning signals (S1, S2. S3), so that the stored instantaneous values of the scanning signals (S1, S2, S3) are instantaneous values which have appeared at a common time at the scanning location (A).

[0056] The second embodiment of the invention in summation also relates to a position measuring device, having

[0057] a scanning location (A) for the generation of a plurality of position-dependent scanning signals (S1, S2, S3),

[0058] scanning channels (K1, K2, K3) for transmitting the scanning signals (S1, S2, S3) from the scanning location (A) to storage elements (13, 14, 15), wherein a scanning channel (K1, K2, K3) and a storage element (13, 14, 15) are assigned to each scanning signal (S1, S2, S3),

[0059] an evaluating unit (16) for forming a measured position value (P) from instantaneous values of the scanning signals (S1, S2, S3) retrieved from the storage elements (13, 14, 15),

[0060] means (20, 21, 22) for individually affecting the transit times of the scanning signals (S1, S2, S3) in the scanning channels (K1, K2, K3), so that the stored instantaneous values of the scanning signals (S1, S2, S3) are instantaneous values which have appeared at a common time at the scanning location (A). 

1. A method for position determination with the following method steps: generation of several position-dependent scanning signals (S1, S2, S3), transmission of each one of the scanning signals (S1, S2, S3) from a scanning location (A) via a scanning channel (K1, K2, K3) to a storage element (13, 14, 15), storage of an instantaneous value present at the storage element (13, 14, 15) at a storage time, formation of a measured position value (P) from the stored instantaneous values of the scanning signals (S1, S2, S3), characterized in that the transit times of the scanning signals (S1, S2, S3) are different in at least two scanning channels (K1, K2, K3), and storage takes place at times matched to the different transit times, so that the stored instantaneous values of the scanning signals (S1, S2, S3) are instantaneous values which have appeared at a common time at the scanning location (A).
 2. A method for position determination with the following method steps: generation of several position-dependent scanning signals (S1, S2, S3), transmission of each one of the scanning signals (S1, S2, S3) from a scanning location (A) via a scanning channel (K1, K2, K3) to a storage element (13, 14, 15), storage of an instantaneous value present at the storage element (13, 14, 15) at a storage time, formation of a measured position value (P) from the stored instantaneous values of the scanning signals (S1, S2, S3), characterized in that different transit times of the scanning signals (S1, S2, S3) in the scanning channels (K1, K2, K3) are compensated by means of the individual delay of the scanning signals (S1, S2. S3), so that the stored instantaneous values of the scanning signals (S1, S2, S3) are instantaneous values which have appeared at a common time at the scanning location (A).
 3. The method in accordance with claims 1 or 2, characterized in that periodic scanning signals (S1, S2, S3) with the same period, which are phase-shifted in relation to each other, are generated at the scanning location (A), and the measured position value (P) is formed by interpolation.
 4. The method in accordance with claims 1 or 3, characterized in that the storage of the instantaneous values is caused by a common storage command (T), wherein the storage command (T) is provided with a different delay to at least two storage elements (13, 14, 15).
 5. The method in accordance with one of claims 1, 3 or 4, characterized in that the storage of the instantaneous values is caused by a common storage command (T), wherein the storage command (T) is provided with a delay to the storage elements (13, 14, 15), and the delay time is set to equal the transit time in the respective scanning channel (K1, K2, K3).
 6. The method in accordance with claims 4 or 5, characterized in that the delay time is set as a function of the instantaneous frequency of the scanning signals (S1, S2, S3).
 7. A position measuring device, having a scanning location (A) for the generation of a plurality of position-dependent scanning signals (S1, S2, S3), scanning channels (K1, K2, K3) for transmitting the scanning signals (S1, S2, S3) from the scanning location (A) to storage elements (13, 14, 15), wherein a scanning channel (K1, K2, K3) and a storage element (13, 14, 15) are assigned to each scanning signal (S1, S2, S3), an evaluating unit (16) for forming a measured position value (P) from instantaneous values of the scanning signals (S1, S2, S3) retrieved from the storage elements (13, 14, 15), characterized by means (20, 21, 22) for causing the storage of instantaneous values of the scanning signals (S1, S2, S3) for compensating different transit times of the scanning signals (S1, S2, S3) in the scanning channels (K1, K2, K3) at different times, so that the stored instantaneous values of the scanning signals (S1, S2, S3) are instantaneous values which had appeared at a common time at the scanning location (A).
 8. A position measuring device, having a scanning location (A) for the generation of a plurality of position-dependent scanning signals (S1, S2, S3), scanning channels (K1, K2, K3) for transmitting the scanning signals (S1, S2, S3) from the scanning location (A) to storage elements (13, 14, 15), wherein a scanning channel (K1, K2, K3) and a storage element (13, 14, 15) are assigned to each scanning signal (S1, S2, S3), an evaluating unit (16) for forming a measured position value (P) from instantaneous values of the scanning signals (S1, S2, S3) retrieved from the storage elements (13, 14, 15), characterized by means (20, 21, 22) for individually affecting the transit times of the scanning signals (S1, S2, S3) in the scanning channels (K1, K2, K3), so that the stored instantaneous values of the scanning signals (S1, S2, S3) are instantaneous values which have appeared at a common time at the scanning location (A).
 9. The position measuring device in accordance with claims 7 or 8, characterized in that the scanning signals (S1, S2, S3) are periodic scanning signals (S1, S2, S3) with the same period, which are phase-shifted in relation to each other, and the evaluating unit is an interpolation unit (16) for dividing a period.
 10. The position measuring device in accordance with claim 9, characterized in that the phase shift is 120° or 90°.
 11. The position measuring device in accordance with claim 7, characterized in that a storage command (T1, T2, T3) is sent to each storage element (13, 14, 15), which causes the storage of an existing instantaneous value, and that the storage commands (T1, T2, T3) are derived from a common storage command (T), wherein at least one of the storage commands (T1, T2, T3) is the delayed storage command (T), which is delayed by means of a delay member (20, 21, 22).
 12. The position measuring device in accordance with claim 11, characterized in that a delay member (20, 21, 22) for the individual delay of the common storage command (T) is assigned to each storage element (13, 14, 15).
 13. The position measuring device in accordance with claim 12, characterized in that the delay times of the delay members (20, 21, 22) assigned to the scanning channels (K1, K2, K3) correspond to the transit time of the scanning signals (S1, S2, S3) in the respective scanning channels (K1, K2, K3). 